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    Photovoltaic Dustproof Test Chamber

    Photovoltaic Dustproof Test Chamber

    Product Introduction
    Photovoltaic dustproof test chamber is suitable for evaluating the resilience of all mechanical, optical, electrical, electronic, electrochemical and electro-mechanical devices that may be exposed to dry sandblasted, dustblasted or dustfall conditions.

    Service Hotline

    4000-662-888
    Product Features
    Product Parameter
    Studio Size? (D*W*H)mm 1400×2400×900(D*W*H)mm
    Dimension(D*W*H)mm 6000×9650×3700(D*W*H)mm
    temperature range 23℃~70℃
    temperature deviation ≤±2℃
    Humidity range <30%RH
    Dust blowing air speed 1.5~10 m/s
    Sand blowing wind speed 18.0~30.0 m/s
    Blowing Dust Concentration 3.0~17.6 g/m3 (10.7 ± 7 g/m3)
    sandblast concentration 0.18 + 0.2 g/m3;1.1 ± 0.3 g/m3;2.2 ± 0.5 g/m3
    Test dust quartz dust
    Sand Size ≤ 149 μm to pass through a 150 μm diameter mesh.
    viewing window 800×500mm(Effective vision)
    Outer case material High quality A3 steel plate electrostatic spraying
    Inner box material Imported high-grade stainless steel SUS304
    Temperature Controller Imported “UEC” brand temperature and humidity meter
    Temperature: 5℃~+35℃(Average temperature over 24 hours ≤ 28°C)
    Relative Humidity: ≤85%RH
    Barometric pressure: 86kPa~106kPa
    Supply Voltage AC380V±10% 60Hz
    Power Approx. 45.0kW
    Note:
    1、 the above data are in the use of ambient temperature of 25 ℃ and well ventilated conditions measured
    2、Can be customized according to the specific requirements of the user non-standard photovoltaic dustproof test chamber etc
    3、This technical information, if there is any change without prior notice

     

    Product Recommendation
    Industry News
    Cold and hot shock test chambers utilize high-temperature and low-temperature zones during testing.
    High-low temperature test chambers are the cornerstone of environmental reliability testing. The quality of their performance directly determines the credibility of product qualification and the length of the R&D cycle.
    Regularly, staff should master some troubleshooting and handling methods for high and low temperature alternating test chambers. If the equipment exhibits unstable low temperatures, what causes this phenomenon, and how should we address these faults?
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